Test time reduced from 15 seconds to 0.8 seconds per chip; fault coverage >98.5%; zero test escapes after 1M units.
= (DFT area / total logic area) × 100% Target: < 15% for full scan; < 5% for boundary scan only. Test time reduced from 15 seconds to 0
Rather than treating testing as an afterthought, DFT integrates features into the hardware specifically to facilitate testing. Common techniques include: Scan Design: fault coverage >